Search results for "annihilation [electron positron]"
showing 10 items of 29 documents
Study of the Curing Process of DGEBA Epoxy Resin Through Structural Investigation
2015
In this work, a multi-scale approach with different analytical methods is applied to study the curing process and the structural properties of a diglycidyl ether of bisphenol A (DGEBA) epoxy resin. This monomer, thermally cured using 4,4′-diaminodiphenilsulfone (DDS) as hardener, is analyzed after 10, 45, 90, and 120 min of reaction time at 180 °C to obtain information on samples with different cross-linking densities. Samples are also characterized after extraction in acetone in order to obtain structural information on the insoluble parts. For this purpose, differential scanning calorimetry (DSC), dynamic mechanical thermal analysis (DMTA), solid-state nuclear magnetic resonance (ss-NMR),…
Positronium as a probe in natural polymers: decomposition in starch
2009
Ortho-positronium (o-Ps) is used as a probe in positron annihilation lifetime spectroscopy (PALS) experiments, to characterise the behaviour of free volumes in natural starch samples, as a function of temperature (T). Up to about 540 K, the o-Ps intensity, I(3), remains constant at 26.2% while its lifetime, tau(3), is found to increase linearly. Both parameters undergo a decrease above this T, due to the onset of decomposition, which results in a shrinking of the sample pellets. The results indicate that the glass transition temperature should be above 501 K. Data from thermal gravimetry analysis (TGA) measurements are well described by supposing a first order process for the survival proba…
Determination of defect content and defect profile in semiconductor heterostructures
2011
In this article we present an overview of the technique to obtain the defects depth profile and width of a deposited layer and multilayer based on positron annihilation spectroscopy. In particular we apply the method to ZnO and ZnO/ZnCdO layers deposited on sapphire substrates. After introducing some terminology we first calculate the trend that the W/S parameters of the Doppler broadening measurements must follow, both in a qualitative and quantitative way. From this point we extend the results to calculate the width and defect profiles in deposited layer samples.
Positronics of radiation-induced effects in chalcogenide glassy semiconductors
2015
Using As2S3 and AsS2 glasses as an example, the principal possibility of using positron annihilation spectroscopy methods for studying the evolution of the free volume of hollow nanoobjects in chalcogenide glassy semiconductors exposed to radiation is shown. The results obtained by measurements of the positron annihilation lifetime and Doppler broadening of the annihilation line in reverse chronological order are in full agreement with the optical spectroscopy data in the region of the fundamental absorption edge, being adequately described within coordination defect-formation and physical-aging models.
Positron annihilation probing of crystallization effects in TAS-235 glass affected by Ga additions
2014
Abstract Crystallization effects in Te20As30Se50 glass known also as TAS-235 affected by Ga additions to Ga2Te20As28Se50 and Ga5Te20As25Se50 compositions are probed with positron annihilation spectroscopy in the measuring modes exploring positron lifetimes and Doppler broadening of annihilation line. Occurring of cubic-phase Ga2Se3 droplets with character nanoscale sizes in partially-crystallized Ga2Te20As28Se50 alloy is shown to be associated with agglomeration of intrinsic free-volume voids, this process being enhanced over microcrystalline scale in Ga5Te20As25Se50 alloy. Crystallization changes in the void structure of TAS-235 glass are considered in terms of free-volume evolution under …
Defects in Martensitic Stainless Steel 1.4031 (EN) Exposed to Friction as Seen by Positron Annihilation
2010
We present experimental results of measurements of the Doppler broadening of annihilation line and positron annihilation lifetimes in martensitic stainless steel 1.4031 (EN) samples exposed to the dry sliding under different loads. In particular, we tested the subsurface zone under the worn surfaces. As a main result, we obtained information about the defect profiles in this zone and the total extent of the damage region induced by the dry sliding.
Positron Annihilation Study of Defects Induced by Various Cutting Methods in Stainless Steel Grade 304
2011
We report in this article the comparison of the subsurface zones (SZs) in austenitic stainless steel 304 samples created by three cutting techniques, i.e., the laser cutting (LC), abrasive water jet (AWJ), and traditional milling cutting (MC). The crystal lattice defects distribution in this zone were investigated using the positron annihilation method. It was shown that the MC creates the great number mainly edge dislocations decorated by vacancies. Their concentration decreases with the increase of the depth from the cut surface. The total depth of the SZ is extended up to 150 μm from the cut surface. Similar dependency was observed for the AWJ machining but the total depth is much lower,…
Application of Positron Annihilation Spectroscopy to Studies of Subsurface Zones Induced by Wear in Magnesium and Its Alloy AZ31
2011
Interaction of sliding bodies is an important aspect of numerous applications and subject of many studies (Solecki, 1989). Generally, when two surfaces are loaded together the true contact area is much smaller than the apparent one. The true contact is only at high points or asperities of the surfaces where the interactions in the atomic scale take place. Relative movement between the surfaces leads to friction and wear processes. The rate of wear is controlled by the load, the relative velocity and the behaviour of the material near asperities. The region of asperities can be plastically deformed and the stress is transported to the deeper laying region that becomes elastically deformed (F…
'Cold' crystallization in nanostructurized 80GeSe2-20Ga2Se3 glass
2015
International audience; 'Cold' crystallization in 80GeSe 2-20Ga 2 Se 3 chalcogenide glass nanostructurized due to thermal annealing at 380°C for 10, 25, 50, 80, and 100 h are probed with X-ray diffraction, atomic force, and scanning electron microscopy, as well as positron annihilation spectroscopy performed in positron annihilation lifetime and Doppler broadening of annihilation line modes. It is shown that changes in defect-related component in the fit of experimental positron lifetime spectra for nanocrystallized glasses testify in favor of structural fragmentation of larger free-volume entities into smaller ones. Nanocrystallites of Ga 2 Se 3 and/or GeGa 4 Se 8 phases and prevalent GeSe…
The slowing down times of positrons emitted from selected β+ isotopes into metals
2012
Abstract We report the GEANT4 Monte Carlo simulations and the approximated calculations of the slowing down time (SDT) for positrons emitted from three β+ isotopes, i.e., 22Na, 68Ge/68Ga and 48V. The first two isotopes are commonly used in the positron annihilation spectroscopy. The results revealed that the SDT exhibits the nonsymmetrical distribution and its average value depends on the end point energy of the isotope, the density and atomic number of the implanted material. For metals the average SDT varies from 0.4 ps to a few ps. We argue that this can affect the analysis of the measured positron lifetime and should be considered in theoretical calculations. The SDT in selected gases w…